William N. Sharpe
Materials Chemistry · 2001–2008
A researcher in the Science corpus: 5 papers; trusts 3 researchers and is trusted by 14 researchers here, as inferred from the citation graph.
Subfields
- Materials Chemistry — 34 citations into it; #10,573 of 11,513 by trust here, #9,387 by citations
- Mechanics of Materials — 29 citations into it; #1,029 of 6,291 by trust here, #2,416 by citations
- Atomic and Molecular Physics, and Optics — 13 citations into it
- Electrical and Electronic Engineering — 13 citations into it; #14,989 of 16,539 by trust here, #9,631 by citations
- Mechanical Engineering — 12 citations into it
Whom William N. Sharpe trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts William N. Sharpe overall
- Qianbing Zhang
- Xihong Zhang
- J. Stinville
- K. Hemker
- Jian Zhao
- Hong Hao
- M. Echlin
- D. Gianola
- Yanchao Shi
- H. Xing
Papers from William N. Sharpe's perspective
Ordered by how strongly the researchers William N. Sharpe trusts endorse each paper. Same corpus, a different order for every researcher.
- Fundamentals of Microfabrication
- Effect of specimen size on Young's modulus and fracture strength of polysilicon
- Plasticity size effects in free-standing submicron polycrystalline FCC films subjected to pure tension
- Microsample tensile testing of nanocrystalline copper
- Coupling grain boundary motion to shear deformation
- Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing
- The influence of time, temperature, and grain size on indentation creep in high-purity nanocrystalline and ultrafine grain copper
- Strain gradient plasticity
- Size-affected single-slip behavior of pure nickel microcrystals
- A and V
Their papers
- Microscale Characterization of Mechanical Properties (2007) — 298 citations
- Springer Handbook of Experimental Solid Mechanics (2008) — 585 citations
- Effect of specimen size on Young's modulus and fracture strength of polysilicon (2001) — 200 citations
- Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing (2006) — 160 citations
- Comparison of tensile and bulge tests for thin-film silicon nitride (2004) — 149 citations