Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing

By William N. Sharpe, J. Pulskamp, D. Gianola, Chris Eberl, Ronald Polcawich, Richard E. Thompson. 2006

160 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/eee2e89da962731c94cb0191bd11627eb6c54785

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. William N. Sharpe

In Biomedical Engineering

1. K. Hemker
2. Qianbing Zhang
3. Jian Zhao

In Electrical and Electronic Engineering

1. K. Hemker
2. William N. Sharpe

Citations in the corpus

• Microscale Characterization of Mechanical Properties (2007, methodology): “The sharpness of the linear-elastic data sets illustrates the fidelity of these strain measurement techniques ( 50 ).”