Solid-state lighting: failure analysis of white LEDs
By N. Narendran, Yimin Gu, Jean Paul Freyssinier, H. Yu, L. Deng. 2004
596 citations recorded by the source corpus.
Subfields: Condensed Matter Physics, Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/d2f4e5cd8a7aa22b28160d96b848682c2155e695
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Condensed Matter Physics
- Michael G. Pecht
- Gaudenzio Meneghesso
- Matteo Meneghini
- Enrico Zanoni
- Prabhakar V. Varde
- Diganta Das
- Moon-Hwan Chang
- Xiaobing Luo
In Electrical and Electronic Engineering
- Matteo Meneghini
- Michael G. Pecht
- Gaudenzio Meneghesso
- Enrico Zanoni
- Prabhakar V. Varde
- Xiaobing Luo
- Diganta Das
- Moon-Hwan Chang
In Materials Chemistry
- Prabhakar V. Varde
- Xiaobing Luo
- Michael G. Pecht
- Diganta Das
- Moon-Hwan Chang
- A. I. Zhmakin
- S. Karpov
Citations in the corpus
- Dark Matters: The Effects of Artificial Lighting on Bats (2016, background): “However, more recently LEDs are able to produce light by combining multiple monochromatic sources (red, green and blue), which allows for greater control over spectral emissions (Narendran et al. 2004; Gaston et al. 2012, 2013; Davies et al. 2013).”
- Light emitting diodes reliability review (2012, background): “Thus, even long-term exposure to visible light can cause polymer and epoxy materials to be degraded [143,144].”
- Enhancement of light extraction from light emitting diodes (2011, background): “Packaging main purpose is to protect LED chips from electrostatic discharge, high temperature that is considered, in particularity, as the cause of generation of defects in the active region [16] (especially in the devices subjected to high injection currents [17]), moisture that can induce delamina”
- Lifetime Estimation of High-Power White LED Using Degradation-Data-Driven Method (2012, methodology): “The estimation results from both methods were discussed and compared.”
- A Review on the Reliability of GaN-Based LEDs (2008, background): “Previous works reported that phosphors do not exhibit any degradation when submitted to similar stress [ 28 ].”
- Accelerated Life Test of High Brightness Light Emitting Diodes (2008, background): “Several authors reported that YAG phosphors employed in LEDs exhibit high stability during operations [4].”
- Phosphor self-heating in phosphor converted light emitting diode packaging (2013, background): “Because of the low thermal conductivity of the encapsulant, local high temperature may appear in the phosphor layer, which would bring many disadvantages, such as peak shift of emitting spectrum, decrement of quantum efficiency, phosphor degradation and so on [13,14].”
- A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs (2010, methodology): “The constant improvement of LED technology led to an increase in the robustness of GaN LEDs (in excess of 2 kV HBM): in particular, it was shown that the adoption of SiC as a substrate material can guarantee a better stability with respect to common sapphire substrates since SiC has a better lattice”
- Life of LED-based white light sources (2005, background): “LED packages is the yellowing of the epoxy that is caused by excessive heat at the p-n-junction of the LED [10].”