Light emitting diodes reliability review

By Moon-Hwan Chang, Diganta Das, Prabhakar V. Varde, Michael G. Pecht. Microelectronics and reliability, 2012

729 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/d08a2f386acded08a31a1fa945fdb00fababa00b

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In Electrical and Electronic Engineering

1. Jinhui Li
2. Xianlai Zeng

Citations in the corpus

• Rare Earth Elements Recovery from Waste Fluorescent Lamps: A Review (2015, background): “Department of Energy, 2011), and the demand for them is projected to grow consistently (Chang et al., 2012; Fan et al., 2012; Pecht et al., 2012).”
• MicroLED technologies and applications: characteristics, fabrication, progress, and challenges (2020, positive): “EQE reduction in the second stage is contributed to the stresses by injected carriers and high junction temperatures, which cause the defects and contact degradation [104, 106].”