A fast, high-endurance and scalable non-volatile memory device made from asymmetric Ta2O(5-x)/TaO(2-x) bilayer structures.
By Myoung-Jae Lee, Chang Bum Lee, Dongsoo Lee, Seung Ryul Lee, Man Chang, J. Hur, Young-Bae Kim, Changjung Kim, D. Seo, S. Seo and 3 more. Nature Materials, 2011
2,083 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/ca75bb4d0cc01ee389ab3cc5161499b12fb136d6
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In Electrical and Electronic Engineering
- Daniele Ielmini
- H. Philip Wong
- Shimeng Yu
- Ximeng Guan
- Federico Nardi
- David C. Gilmer
- S. Larentis
- Simone Balatti
Citations in the corpus
- Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part I: Experimental Study (2012, background): “This might be due to the relatively large electrode area, since a deviation from constant R was observed in recent works addressing nanoscaled RRAMs [12], [23].”