Auger recombination in InGaN measured by photoluminescence
By Y. Shen, G. Mueller, S. Watanabe, N. Gardner, A. Munkholm, Michael R. Krames. 2007
1,098 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
View Paper: https://www.semanticscholar.org/paper/88b6f782b224ba2193f58d05d94d11e7e0c88916
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In Atomic and Molecular Physics, and Optics
In Condensed Matter Physics
In Electronic, Optical and Magnetic Materials
Citations in the corpus
- ABC-model for interpretation of internal quantum efficiency and its droop in III-nitride LEDs: a review (2014, positive): “Being the basis for the guess on the influential role of Auger recombination for LED efficiency [1], the ABC-model turned out to be helpful for finding effective ways to improve the device performance [2].”
- Asymmetry of carrier transport leading to efficiency droop in GaInN based light-emitting diodes (2011, background): “Several mechanisms have been proposed to explain efficiency droop, including electron leakage due to polarization mismatch [1], poor hole injection [2], delocalization of carriers [3], and Auger recombination [4].”
- History of Gallium–Nitride-Based Light-Emitting Diodes for Illumination (2013, background): “As a result, high carrier densities are present in the active region, which exacerbate the effects of Auger recombination [68], [69] and, potentially, carrier oveflow leakage [70], [71], resulting in strong efficiency droop.”
- Advances in the LED Materials and Architectures for Energy-Saving Solid-State Lighting Toward “Lighting Revolution” (2012, background): “Though the root-cause of the droop is still debatable, various models have been adopted to explain the droop, such as junction heating [10], electron overflow [11], [12], reduced effective radiative recombination rate due to the elevated plasma temperature caused by carrier–carrier and carrier–photo”
- LEDs for Solid-State Lighting: Performance Challenges and Recent Advances (2009, background): “to efficiency loss at high carrier densities [57].”
- Semipolar $({\hbox{20}}\bar{{\hbox{2}}}\bar{{\hbox{1}}})$ InGaN/GaN Light-Emitting Diodes for High-Efficiency Solid-State Lighting (2013, background): “Several mechanisms have been proposed as the origin of efficiency droop, including Auger recombination [2]–[4], electron leakage [5], [6], and carrier delocalization to defects [7].”