Vertical Silicon-Nanowire Formation and Gate-All-Around MOSFET
By Bin Yang, K. Buddharaju, S. Teo, Navab Singh, Guo-Qiang Lo, D. Kwong. IEEE Electron Device Letters, 2008
222 citations recorded by the source corpus.
Subfields: Biomedical Engineering, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/793b627006fc27da615840e162ff1f16d0be233a
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In Biomedical Engineering
In Electrical and Electronic Engineering
Citations in the corpus
- Vertical Si-Nanowire $n$-Type Tunneling FETs With Low Subthreshold Swing ($\leq \hbox{50}\ \hbox{mV/decade}$ ) at Room Temperature (2011, background): “(∼70 mV/V) is achieved as a result of excellent gate control by GAA structure [4], [11], and [12].”
- A Tunnel FET for $V_{DD}$ Scaling Below 0.6 V With a CMOS-Comparable Performance (2011, background): “It is well understood that at such a tunnel distance BTBT current has to be extremely low, which is responsible for the device’s excellent OFF-state behavior.”
- Demonstration of Tunneling FETs Based on Highly Scalable Vertical Silicon Nanowires (2009, methodology): “was fabricated by either chemical synthesis [18] or using fully CMOS-compatible technology [19], have been demonstrated.”