Circuit Modeling and Performance Analysis of Multi-Walled Carbon Nanotube Interconnects
By Hong Li, Wen-Yan Yin, Kaustav Banerjee, J. Mao. IEEE Transactions on Electron Devices, 2008
379 citations recorded by the source corpus.
Subfields: Biomedical Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/68ae1838a7ebff891379b287ba303446bcb438e4
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Biomedical Engineering
- Hong Li
- Kaustav Banerjee
- Chuan Xu
- Alessio Tamburrano
- M. Sarto
- Roberto Suaya
- Navin Srivastava
- Wen-Yan Yin
In Materials Chemistry
- Hong Li
- Kaustav Banerjee
- Chuan Xu
- Wen-Yan Yin
- Navin Srivastava
- Alessio Tamburrano
- M. Sarto
- Roberto Suaya
Citations in the corpus
- On the Applicability of Single-Walled Carbon Nanotubes as VLSI Interconnects (2009, neutral): “connect performance [31] and reliability [32].”
- Compact AC Modeling and Performance Analysis of Through-Silicon Vias in 3-D ICs (2010, background): “shorter height implies a higher effective resistivity of MWCNT due to the quantum contact resistance [34].”
- Crosstalk Prediction of Single- and Double-Walled Carbon-Nanotube (SWCNT/DWCNT) Bundle Interconnects (2009, methodology): “In [17], circuit modeling and performance prediction of MWCNT interconnects were performed.”
- Carbon Nanomaterials for Next-Generation Interconnects and Passives: Physics, Status, and Prospects (2009, methodology): “The details of the model for MWCNT (also valid for DWCNT) interconnect can be found in [65].”
- High-Frequency Analysis of Carbon Nanotube Interconnects and Implications for On-Chip Inductor Design (2009, methodology): “Equivalent circuit model [9] of each CNT shell, where Rmc is the imperfect metal–CNT contact resistance, RQ is the quantum resistance, RS is the scattering resistance, LK is the kinetic inductance, LM is the magnetic inductance, CQ is the quantum capacitance, and CE is the electrostatic capacitance.”
- Single-Conductor Transmission-Line Model of Multiwall Carbon Nanotubes (2010, methodology): “Moreover, it results that in case of MWCNT interconnects with all shells parallel connected at both sides, the intershell conductance does not impact sensibly on the signal propagation performance of the interconnect [ 18 ].”
- Modeling, Analysis, and Design of Graphene Nano-Ribbon Interconnects (2009, background): “34 nm, D = 1 nm and lD = 1 μm [48], σ(SWCNT bundles) = 0.”