Temperature dependence of high- and low-resistance bistable states in polycrystalline NiO films
By Kyooho Jung, Hongwoo Seo, Yongmin Kim, H. Im, Jinpyo Hong, Jae-wan Park, Jeon-Kook Lee. 2007
143 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/520e8bb257cfded3c11fb76f8e20f98707837126
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In Electrical and Electronic Engineering
- Daniele Ielmini
- A. L. Lacaita
- U. Russo
- H. Philip Wong
- Rainer Waser
- R. Bruchhaus
- Andrea Leonardo Lacaita
In Polymers and Plastics
Citations in the corpus
- Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices (2009, background): “NiO samples for the set state in [16] and is opposed to the (intrinsic) semiconductorlike behavior which was previously characterized for the reset state at temperatures above 180 K [20].”