Switching the electrical resistance of individual dislocations in single-crystalline SrTiO3
By K. Szot, W. Speier, G. Bihlmayer, Rainer Waser. Nature Materials, 2006
1,567 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/4bdc47dce0e9b4af07e435500cb06160550c27ff
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In Electrical and Electronic Engineering
- Daniele Ielmini
- Rainer Waser
- R. Bruchhaus
- Federico Nardi
- David C. Gilmer
- Simone Balatti
- S. Larentis
- Masakazu Aono
In Materials Chemistry
Citations in the corpus
- Resistive Switching by Voltage-Driven Ion Migration in Bipolar RRAM—Part II: Modeling (2012, background): “In most cases, the resistance change in metal oxides is due to the formation of a conductive filament (CF), which is then subsequently dissolved and reconstructed through localized redox [3], [4] or ion-migration processes [2], [5]–[10].”