Negative bias temperature instability: What do we understand?

By Dieter K. Schroder. Microelectronics and reliability, 2007

397 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/2fdd6c729c240d053194fbf0963f94db40ee3b2f

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Tibor Grasser
2. Ben Kaczer
3. Hans Reisinger

Citations in the corpus

• The Universality of NBTI Relaxation and its Implications for Modeling and Characterization (2007, background): “NBTI is mostly described by a shift of the threshold voltage when a typically large negative voltage is applied to the gate of a pMOS at elevated temperatures [12] [13].”