Impact ionization MOS (I-MOS)-Part II: experimental results

By Kailash Gopalakrishnan, R. Woo, Christoph Jungemann, Peter B. Griffin, James D. Plummer. IEEE Transactions on Electron Devices, 2005

149 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/22bd9107cd8060392e6c5621f72bd754d2ce20aa

Citations in the corpus

• The Tunnel Source (PNPN) n-MOSFET: A Novel High Performance Transistor (2008, unknown): “carriers instead of diffusion ([7], [8]).”