GaN on Si Technologies for Power Switching Devices
By M. Ishida, T. Ueda, Tsuyoshi Tanaka, D. Ueda. IEEE Transactions on Electron Devices, 2013
368 citations recorded by the source corpus.
Subfields: Condensed Matter Physics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/0759a165ffbfa5eec68760bdaec86a344d392378
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In Condensed Matter Physics
In Electrical and Electronic Engineering
Citations in the corpus
- Dynamic On-Resistance in GaN Power Devices: Mechanisms, Characterizations, and Modeling (2019, methodology): “been developed: 1) two-chip hybrid cascode configuration with a low-voltage Si metal-oxide-semiconductor field-effect transistor (MOSFET) and a high-voltage normally on GaN metal-insulator-semiconductor (MIS)-HEMT [6], [12] and 2) single-chip normally off GaN transistor by implementing p-type (Al)Ga”
- Reliability and parasitic issues in GaN-based power HEMTs: a review (2016, background): “Thanks to the excellent properties of the material, kW-range power converters with efficiency higher than 99% have already been demonstrated [4].”