M. Moram
Materials Chemistry · 2009–2013
A researcher in the Science corpus: 4 papers; trusts 3 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Materials Chemistry — 25 citations into it
Whom M. Moram trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from M. Moram's perspective
Ordered by how strongly the researchers M. Moram trusts endorse each paper. Same corpus, a different order for every researcher.
- Electronic band structure of wurtzite GaN under biaxial strain in the M plane investigated with photoreflectance spectroscopy
- Crystallite size distribution and dislocation structure determined by diffraction profile analysis: principles and practical application to cubic and hexagonal crystals
- Group III nitride and SiC based MEMS and NEMS: materials properties, technology and applications
- Defect and Microstructure Analysis by Diffraction
- Structure and electronic properties of InN and In-rich group III-nitride alloys
- Microstructure of heteroepitaxial GaN revealed by x-ray diffraction
- Anisotropic thermal expansion in wurtzite-type crystals
- Bulk nanostructured materials from severe plastic deformation
- The Hardness of Metals
- Effect of a crystallite size distribution on X‐ray diffraction line profiles and whole‐powder‐pattern fitting
Their papers
- Elastic constants and critical thicknesses of ScGaN and ScAlN (2013) — 134 citations
- Tunable optoelectronic and ferroelectric properties in Sc-based III-nitrides (2013) — 190 citations
- On the origin of threading dislocations in GaN films (2009) — 133 citations
- X-ray diffraction of III-nitrides (2009) — 1,053 citations