Microstructure of heteroepitaxial GaN revealed by x-ray diffraction

By R. Chierchia, T. Böttcher, H. Heinke, S. Einfeldt, S. Figge, D. Hommel. 2003

371 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/aca24e460052df5c9dee53215a07615af8ceeb79

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Materials Chemistry

1. M. Vickers
2. M. Moram

Citations in the corpus

• X-ray diffraction of III-nitrides (2009, background): “Formulae for a random distribution of dislocations have been proposed by Kurtz et al [177]: DB = β 2 9b2 , (4.7) and Dunn and Koch [178]: DB = β 2 4.35b2 .”