V. Afanas'ev
Materials Chemistry · 2003–2012
A researcher in the Science corpus: 5 papers; trusts 4 researchers and is trusted by 1 researcher here, as inferred from the citation graph.
Subfields
- Materials Chemistry — 61 citations into it; #9,758 of 11,513 by trust here, #5,878 by citations
- Electrical and Electronic Engineering — 35 citations into it; #14,588 of 16,539 by trust here, #8,802 by citations
- Atomic and Molecular Physics, and Optics — 26 citations into it
Whom V. Afanas'ev trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts V. Afanas'ev overall
Papers from V. Afanas'ev's perspective
Ordered by how strongly the researchers V. Afanas'ev trusts endorse each paper. Same corpus, a different order for every researcher.
- Phonons and related crystal properties from density-functional perturbation theory
- Two-Dimensional Nanosheets Produced by Liquid Exfoliation of Layered Materials (Science)
- QUANTUM ESPRESSO: a modular and open-source software project for quantum simulations of materials (Journal of Physics: Condensed Matter)
- Two- and one-dimensional honeycomb structures of silicon and germanium. (Physical Review Letters)
- Atomically thin MoS₂: a new direct-gap semiconductor. (Physical Review Letters)
- Generalized Gradient Approximation Made Simple.
- Single-layer MoS2 transistors. (Nature Nanotechnology)
- Raman spectroscopy of graphene and graphite: Disorder, electron phonon coupling, doping and nonadiabatic effects
- Semiempirical GGA‐type density functional constructed with a long‐range dispersion correction (Journal of Computational Chemistry)
- Electronic properties of MoS2 nanoparticles
Their papers
- Strain-induced semiconductor to metal transition in the two-dimensional honeycomb structure of MoS2 (2011) — 620 citations
- Vibrational properties of silicene and germanene (2012) — 161 citations
- High-k dielectrics for future generation memory devices (Invited Paper) (2009) — 234 citations
- Internal photoemission at interfaces of high-κ insulators with semiconductors and metals (2007) — 245 citations
- Mechanisms responsible for improvement of 4H-SiC/SiO2 interface properties by nitridation (2003) — 189 citations