Pseudo-Two-Dimensional Model for Double-Gate Tunnel FETs Considering the Junctions Depletion Regions
By Marie Garcia Bardon, H. P. Neves, Robert Puers, C. Hoof. IEEE Transactions on Electron Devices, 2010
247 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/96e88abc1706ce8f9bb7b66170bb5830c26485cc
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Citations in the corpus
- Comparative Performance Analysis of the Dielectrically Modulated Full- Gate and Short-Gate Tunnel FET-Based Biosensors (2015, background): “The tunnel FETs (TFETs) are emerging as the potential substitute for several gate engineered MOSFETs due to its superior performance in terms of speed, power dissipation, and subthreshold swing [17]–[20].”
- A 2-D Analytical Model for Double-Gate Tunnel FETs (2014, background): “Many 2-D studies on TFET modeling analytically calculate the tunneling generation rate using 2-D electric field, but the tunneling current is computed by numerically integrating over the volume of the device [10]–[13].”
- A Dielectric-Modulated Tunnel-FET-Based Biosensor for Label-Free Detection: Analytical Modeling Study and Sensitivity Analysis (2012, background): “The 2-D Poisson equation (1) (neglecting the mobile charges [17]) is solved in five regions, viz.”
- 2-D Analytical Modeling of the Electrical Characteristics of Dual-Material Double-Gate TFETs With a SiO2/HfO2 Stacked Gate-Oxide Structure (2017, background): “following boundary conditions [25]: ψ0 = ψ1(0, y) = −VT ln(N1/ni ) (7) ψ1 = ψ1(L1, y) = ψ2(L1, y) (8) ψ2 = ψ2(L1 + L2, y) = ψ3(L1 + L2, y) (9) ψ3 = ψ3(L1 + L2 + L3, y) = ψ4(L1 + L2 + L3, y) (10) ψ4 = ψ4(L1 + L2 + L3 + L4, y) = VT ln(N3/ni )+ VDS”