Low-cost and nanoscale non-volatile memory concept for future silicon chips
By M. Lankhorst, B. Ketelaars, Rob Wolters. Nature Materials, 2005
1,056 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/82165a795fcb570c3d047d31fff0c63995b10ebd
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In Electrical and Electronic Engineering
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Citations in the corpus
- Resonant bonding in crystalline phase-change materials. (2008, background): “It could enable phase-change memory to replace flash memory in the future and has the potential to create a ‘universal memory’ that might compete with the speed of dynamic random access memor”
- Phase-change random access memory: A scalable technology (2008, methodology): “Several groups have studied phase-change memory scaling [13, 23].”
- Overview of emerging nonvolatile memory technologies (2014, background): “Volatile memories consist mostly of DRAM [17], which can be further classified into SDRAM and mobile RAM which only retain information when current is constantly supplied to the device [18].”
- Phase change memory technology (2010, background): “Several factors contribute to nucleation and growth kinetics: temperature[98], composition[77, 99, 100], material interfaces[101], device geometry[77, 102], device size[33, 103], material thickness[42, 66], polarity[104], and device history[96, 97].”
- Interfacial phase-change memory. (2011, neutral): “The local atomic structure transformed into the cubic crystalline phase at a temperature of 155 ± 10 °C, which is consistent with the crystallization temperature of the Ge 2 Sb 2 Te 5 (GST) composite allo”