The High-k Solution
By Robert S. Chau, Tahir Ghani. IEEE spectrum, 2007
329 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/7ae7ccb7d52fa0154419b3a08e6deb69958767c3
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Electrical and Electronic Engineering
- Yiran Ma
- Xingwen Yi
- William Shieh
- Qi Yang
- Dmitri E. Nikonov
- Siyu Koswatta
- Mark S. Lundstrom
- Andras Kis
Citations in the corpus
- High-K materials and metal gates for CMOS applications (2015, unknown): “The incorporation of high-K dielectrics with metal gates into a manufacturable, high volume transistor process is the result of tremendous ingenuity and effort by many scientists and engineers [1].”
- Coherent optical OFDM: has its time come? [Invited] (2008, background): “Given the fact that Intel will soon produce their next-generation Penryn CPUs from their forthcoming 45 nm manufacturing process based on high-k technology [53], the CMOS ASIC chip for CO-OFDM can potentially migrate to the same process in the near future.”
- Single-layer MoS2 transistors. (2011, background): “7 eV and the fact that it is commonly used as a gate dielectric both by the research community and major microprocessor manufacturer”
- Performance Comparison Between p-i-n Tunneling Transistors and Conventional MOSFETs (2008, background): “into semiconductor technology has also allowed much needed reduction in gate leakage and improved the scalability of future devices [3].”