The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs
By Austin Lesea, Saar Drimer, J. Fabula, Carl Carmichael, Peter Alfke. IEEE transactions on device and materials reliability, 2005
224 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Hardware and Architecture
View Paper: https://www.semanticscholar.org/paper/7939aeedb7cbb29d17bae73d19ee06c0f1f54198
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In Electrical and Electronic Engineering
In Hardware and Architecture
Citations in the corpus
- Monte Carlo Simulation of Single Event Effects (2010, background): “However, such an approach can be prohibitively time consuming or expensive [13].”