Fundamentals of Carrier Transport, 2nd edn
By Mark S. Lundstrom. 2002
254 citations recorded by the source corpus.
Subfields: Physical and Theoretical Chemistry, Surfaces, Coatings and Films
View Paper: https://www.semanticscholar.org/paper/613101813d9bf25d1913a3281aa92f22fe84d359
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In Physical and Theoretical Chemistry
- Eric Pop
- Kenneth E. Goodson
- Hongjie Dai
- D. Mann
- Mark S. Lundstrom
- Supriyo Datta
- Zhibin Ren
- Eric A. Vittoz
In Surfaces, Coatings and Films
- Eric Pop
- Kenneth E. Goodson
- Hongjie Dai
- D. Mann
- Mark S. Lundstrom
- Supriyo Datta
- Zhibin Ren
- Eric A. Vittoz
Citations in the corpus
- Charge-Based MOS Transistor Modeling: The EKV Model for Low-Power and RF IC Design (2006, background): “2, actually arises as an approximation of [122, 123, 129]”
- Electrical and thermal transport in metallic single-wall carbon nanotubes on insulating substrates (2006, methodology): “This total, effective electron MFP is obtained from Matthiessen’s approximation [34] as”
- Uniaxial-process-induced strained-Si: extending the CMOS roadmap (2006, background): “There is also a fair amount of uncertainty in surface roughness scattering particularly on a (110) wafer since the commonly used universal mobility versus effective oxide field Eeff applies only to the (100) substrate [55], [56].”
- Carrier transport in HfO/sub 2//metal gate MOSFETs: physical insight into critical parameters (2006, methodology): “To complete the study, we have made the calculation of the RCS-limited mobility μRCS,theo for electrons using the momentum relaxation time approach [36].”
- Essential physics of carrier transport in nanoscale MOSFETs (2000, methodology): “(See Chapter 9 in [25] for an alternative derivation of this result.”