Emerging memories: resistive switching mechanisms and current status
By Doo Seok Jeong, Reji Thomas, R. Katiyar, J. Scott, Hermann Kohlstedt, A. Petraru, C. S. Hwang. Reports on progress in physics. Physical Society, 2012
1,027 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/4aa51a1301ad87216f8e37130f5c0db15bdcf3f5
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In Electrical and Electronic Engineering
- Uwe Schroeder
- Thomas Mikolajick
- I. Fina
- Vincent Garcia
- J. MacManus‐Driscoll
- M. Lira-Cantú
- B. Dkhil
- G. Niklasson
In Materials Chemistry
- Uwe Schroeder
- Thomas Mikolajick
- Vincent Garcia
- Manuel Bibes
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- M. Lira-Cantú
- B. Dkhil
In Polymers and Plastics
Citations in the corpus
- Ferroelectric tunnel junctions for information storage and processing (2014, background): “The widespread development of these memories is however limited owing to the capacitive readout of the information (the polarization) that prevents the scalability of FeRAMs up to gigabit densities and necessitates the rewriting of information after readout (destructive readout) 2 .”