Fundamentals of III-V Semiconductor MOSFETs
By S. Oktyabrsky, Peide D. Ye. 2010
236 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/35963be702572f1a81fc473c537a64791ec6080f
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In Electrical and Electronic Engineering
Citations in the corpus
- A Comparative Study on the Impacts of Interface Traps on Tunneling FET and MOSFET (2014, background): “interface would be quite different [29].”