R. Egerton
Micron · 2004–2008
A researcher in the Science corpus: 3 papers; trusts 3 researchers and is trusted by 3 researchers here, as inferred from the citation graph.
Whom R. Egerton trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts R. Egerton overall
Papers from R. Egerton's perspective
Ordered by how strongly the researchers R. Egerton trusts endorse each paper. Same corpus, a different order for every researcher.
- Plasmon spectroscopy of free-standing graphene films
- MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE
- Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy (Science)
- Transmission electron energy loss spectrometry in materials science and the EELS atlas
- Inhomogeneous Electron Gas
- Effect of valence electron concentration on stability of fcc or bcc phase in high entropy alloys
- Differential phase-contrast microscopy at atomic resolution (Nature Physics)
- Electronic and thermodynamic criteria for the occurrence of high entropy alloys in metallic systems
- Magnetic and vibrational properties of high-entropy alloys
- Distributed Representations of Words and Phrases and their Compositionality (Neural Information Processing Systems)
Their papers
- Radiation damage in the TEM and SEM. (2004) — 2,021 citations
- Electron energy-loss spectroscopy in the TEM (2008) — 801 citations
- Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (2005) — 704 citations