Radiation damage in the TEM and SEM.

By R. Egerton, P. Li, M. Malac. Micron, 2004

2,021 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/dac3c16015f6e7f6ca0e5ab04f2a2d3513588da8

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Francesco Bonaccorso
2. Andrea C. Ferrari
3. C. Backes
4. Xiaodong Zhuang
5. A. Ciesielski
6. Paolo Samorì
7. A. Castellanos-Gómez
8. Xinliang Feng

In Radiation

1. Andrea C. Ferrari

In Surfaces, Coatings and Films

1. A. Castellanos-Gómez
2. U. Kaiser
3. Chang Q. Sun
4. Costas Galiotis

Citations in the corpus

• Transmission electron microscopy investigation of separated nucleation and in-situ nucleation in AA7050 aluminium alloy (2018, background): “11 The determination of the threshold electron-beam en ergy (E0) depends on the displacement energy of atoms (E d) in the samples [62, 64-67].”
• Thermo-mechanical behavior of low-dimensional systems: The local bond average approach (2009, background): “According to Egerton [324], the temperature rise of a TEM specimen in micrometer size caused by electron beam in the TEM is less than 2 K.”