Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

By R. Egerton. 2005

704 citations recorded by the source corpus.

Subfields: Radiation, Structural Biology, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/392af3f08c527832a863769e7efe49f6b537c127

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Radiation

1. J. V. van Deventer
2. J. Provis

Citations in the corpus

• Microscopy and microanalysis of inorganic polymer cements. 1: remnant fly ash particles (2009, background): “Although both secondary electrons and X-rays are actually generated in the same interaction volume, secondary electrons have low energy, mostly\10 eV, and are only able to escape from within 2 nm of the surface of the specimen [37].”