Excellent passivation of highly doped p-type Si surfaces by the negative-charge-dielectric Al2O3
By B. Hoex, Jan Schmidt, R. Bock, P. Altermatt, Van de Sanden, W. Kessels. 2007
414 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/fc6828ba7170b21ba0cf13ddac8f05db3bd736f5
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In Electrical and Electronic Engineering
Citations in the corpus
- High-Efficiency n-Type HP mc Silicon Solar Cells (2017, neutral): “3 μm) and then were passivated by PA-ALD-deposited Al2O3 (10 nm) [25], [26].”
- High-Efficiency c-Si Solar Cells Passivated With ALD and PECVD Aluminum Oxide (2010, neutral): “2049190 and heavily doped p-type Si surfaces [9], [10].”
- Passivating Contacts for Crystalline Silicon Solar Cells: From Concepts and Materials to Prospects (2018, methodology): “instance, a hole-selective tunneling contact has been devised by placing an ultrathin (< 2 nm) layer of Al2O3 (which is known for its surface passivating properties, large bandgap, and large negative fixed charge density (−Qf ) [116], [117]) between n-Si and an aluminum doped zinc oxide (ZnO:Al) fil”