On the film density using high power impulse magnetron sputtering
By M. Samuelsson, D. Lundin, J. Jensen, M. Raadu, J. Gudmundsson, Ulf Helmersson. 2010
389 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/e8304f238e5ec4bf2b59017cc32f350df8a132fb
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In Electrical and Electronic Engineering
In Materials Chemistry
In Mechanics of Materials
Citations in the corpus
- A review comparing cathodic arcs and high power impulse magnetron sputtering (HiPIMS) (2014, background): “In most but not all cases notably lower (several 10% lower) compared to the deposition rates of dc sputtering at the same power [309], primarily due to return effect of ionized sputtered material, but also affected by a host of other changes [310] including the energy dependence of the sputter yield”
- An introduction to thin film processing using high-power impulse magnetron sputtering (2012, methodology): “In a recent report by Samuelsson et al.,8 it was found that the rates are typically in the range of 30–80% compared to J. Mater.”