Improvement of peak quantum efficiency and efficiency droop in III-nitride visible light-emitting diodes with an InAlN electron-blocking layer
By Suk Choi, H. Kim, Seong-soo Kim, Jianping Liu, Jeomoh Kim, J. Ryou, R. Dupuis, A. Fischer, F. Ponce. 2010
200 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/d581191d00fcaa460e093502235ee6d409cac707
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In Atomic and Molecular Physics, and Optics
In Condensed Matter Physics
In Electrical and Electronic Engineering
Citations in the corpus
- Visible-Light Communications Using a CMOS-Controlled Micro-Light- Emitting-Diode Array (2012, background): “recombination at defect sites at high carrier density [11], leakage of electrons out of the active region of the device [12] and poor”
- Analysis of Internal Quantum Efficiency and Current Injection Efficiency in III-Nitride Light-Emitting Diodes (2013, background): “Approaches including the use of polarization matched AlGaInN barrier [18], [33], the novel designs of thick barriers and electron blocking layers [34]–[38] as well as the insertion of thin large bandgap materials as thin barriers [20], [39] were investigated to suppress the polarization field effect”