Low subthreshold slope in junctionless multigate transistors
By Chi-Woo Lee, A. Nazarov, Isabelle Ferain, N. Akhavan, Ran Yan, P. Razavi, R. Yu, R. Doria, Jean-Pierre Colinge. 2010
253 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/d1d7ca72192d9b19b27be8ace836b8dadab35f46
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In Electrical and Electronic Engineering
- Suresh Gundapaneni
- Anil Kottantharayil
- S. Ganguly
- Kota Murali
- Mohit Bajaj
- R. Pandey
- Juan Pablo Duarte
- Sung-Jin Choi
Citations in the corpus
- Charge-Plasma Based Process Variation Immune Junctionless Transistor (2014, background): “Although, JLT shows better electrical properties such as reduced short channel effects (SCEs), low OFF current [1]–[5], but variability is high due to random dopant fluctuation (RDF) and it is projected to be a serious problem when scaled to nanoscale dimensions [6]–[8].”
- RF Performance and Small-Signal Parameter Extraction of Junctionless Silicon Nanowire MOSFETs (2011, unknown): “of doping techniques and thermal budget [22]–[24].”
- Low-Voltage Tunnel Transistors for Beyond CMOS Logic (2010, unknown): “Bennett [9] later showed that universal computation can be done with time-reversible (or energyconserving) logic devices, so that the kT lnð2Þ dissipation, associated with erasure of information, can be avoided.”
- Effect of Band-to-Band Tunneling on Junctionless Transistors (2012, background): “[19]; and 5) mobility enhancement due to bulk conduction [16].”
- Simple Analytical Bulk Current Model for Long-Channel Double-Gate Junctionless Transistors (2011, background): “In addition, short-channel effects are more effectively suppressed [1]–[6] in comparison with their counterpart enclosing conventional junctions.”