Simple Analytical Bulk Current Model for Long-Channel Double-Gate Junctionless Transistors
By Juan Pablo Duarte, Sung-Jin Choi, Dong-il Moon, Yang-Kyu Choi. IEEE Electron Device Letters, 2011
189 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/0fe28980b0e92a9c2b506efa8434f990f04c63de
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In Electrical and Electronic Engineering
- Roy P. Paily
- Ratul Kumar Baruah
- Te-Kuang Chiang
- Juan Pablo Duarte
- Sung-Jin Choi
- Yang-Kyu Choi
- Giovanni Neri
Citations in the corpus
- A Dual-Material Gate Junctionless Transistor With High- $k$ Spacer for Enhanced Analog Performance (2014, methodology): “Calibration of our simulated ID–VGS characteristics for SMG DGJLT with [16] at L = 1 μm, Tsi = 10 nm, Tox = 7 nm, ND = 1 × 1019 cm−3, L S /L D = 10 nm, and VDS = 50 mV.”
- A Full-Range Drain Current Model for Double-Gate Junctionless Transistors (2011, background): “Recently, an analytic model for DG-JLFETs has been proposed [5].”
- A Quasi-Two-Dimensional Threshold Voltage Model for Short-Channel Junctionless Double-Gate MOSFETs (2012, background): “Several references in the literature have reported the analytical model for JL double-gate MOSFETs [7]–[10] and JL surroundinggate MOSFETs [11]–[13], all of which only focus on analyzing the long-channel characteristics and cannot predict the shortchannel behavior when the devices are pushed into a ”