Metal-dielectric band alignment and its implications for metal gate complementary metal-oxide-semiconductor technology
By Y. Yeo, Tsu-Jae King, Chenming Calvin Hu. 2002
417 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/c3693a493a5fae34c00f583212047b1204c2721c
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Citations in the corpus
- Fermi pinning-induced thermal instability of metal-gate work functions (2004, background): “Therefore, the work function of the metal-gate materials on HfO is determined by the intrinsic states or MIGS [2], [3], [14].”