Resistive Switching: From Fundamentals of Nanoionic Redox Processes to Memristive Device Applications
By Daniele Ielmini, Rainer Waser. 2016
412 citations recorded by the source corpus.
Subfields: Artificial Intelligence, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/b5873e7f44ee698e405bbba4732bc480eb8d321a
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Artificial Intelligence
- Abu Sebastian
- Giacomo Indiveri
- Wei Dang Lu
- Damien Querlioz
- Fabio Stefanini
- Bryan Perozzi
- Chengqi Zhang
- William L. Hamilton
In Electrical and Electronic Engineering
- Fabio Stefanini
- Ning Qiao
- Saber Moradi
- Abu Sebastian
- M. Le Gallo
- Giacomo Indiveri
- Mario Lanza
- Wei Dang Lu
Citations in the corpus
- Graphene and Related Materials for Resistive Random Access Memories (2017, methodology): “[34] Apart from TMOs, a wide variety of materials have been proposed as switching media in RRAMs, including organic materials,([238]) polymers,([239]) perovskites([240]), GRMs([241]) and amorphous carbons.”
- Memristive technologies for data storage, computation, encryption, and radio-frequency communication (2022, background): “Voltage pulses can change the resistance of the device, and the states are preserved without applying power (4).”
- A Scalable Multicore Architecture With Heterogeneous Memory Structures for Dynamic Neuromorphic Asynchronous Processors (DYNAPs) (2017, background): “The use of on-chip heterogeneous memory structures makes this architecture ideal for exploiting the emerging memory structures based on nano-scale resistive memories [16], [48], [49].”
- Physics for neuromorphic computing (2020, background): “…and control of nanoscale conductive filaments bridging two metallic electrodes separated by an insulating oxide such as tantalum or hafnium oxide 26 , phase transitions leading to conductance changes in materials such as chalcogenides (structural phase transition, caused by Joule effect) 27 or…”