Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets

By Ming-Ju Wu, Jyh-Shing Roger Jang, Jui-Long Chen. IEEE transactions on semiconductor manufacturing, 2015

364 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Media Technology

View Paper: https://www.semanticscholar.org/paper/a581566276f3b2242ec6544c185204a96f17db8a

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1. Deepak V. Kulkarni
2. T. Nakazawa

Citations in the corpus

• Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network (2018, background): “2795466 There are a number of studies for wafer map pattern recognitions [1]–[4].”