T. Nakazawa
IEEE transactions on semiconductor manufacturing · with Kulkarni · 2018
A researcher in the Science corpus: 1 paper; trusts 4 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Whom T. Nakazawa trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from T. Nakazawa's perspective
Ordered by how strongly the researchers T. Nakazawa trusts endorse each paper. Same corpus, a different order for every researcher.
- Neural Codes for Image Retrieval (European Conference on Computer Vision)
- A 20th Anniversary Survey: Introduction to 'Content-Based Image Retrieval at the End of the Early Years'
- ImageNet classification with deep convolutional neural networks
- Deep learning of binary hash codes for fast image retrieval (2015 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW))
- Deep Residual Learning for Image Recognition (Computer Vision and Pattern Recognition)
- Learning Multiple Layers of Features from Tiny Images
- Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets (IEEE transactions on semiconductor manufacturing)
- Attention is All you Need (Neural Information Processing Systems)
- Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation
- ImageNet: A large-scale hierarchical image database