Deepak V. Kulkarni
IEEE transactions on semiconductor manufacturing · 2018
A researcher in the Science corpus: 1 paper; trusts 4 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Whom Deepak V. Kulkarni trusts overall
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Papers from Deepak V. Kulkarni's perspective
Ordered by how strongly the researchers Deepak V. Kulkarni trusts endorse each paper. Same corpus, a different order for every researcher.
- Neural Codes for Image Retrieval (European Conference on Computer Vision)
- A 20th Anniversary Survey: Introduction to 'Content-Based Image Retrieval at the End of the Early Years'
- Deep learning of binary hash codes for fast image retrieval (2015 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW))
- Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets (IEEE transactions on semiconductor manufacturing)
- ImageNet classification with deep convolutional neural networks
- Learning Multiple Layers of Features from Tiny Images
- Deep Residual Learning for Image Recognition (Computer Vision and Pattern Recognition)
- CNN Features Off-the-Shelf: An Astounding Baseline for Recognition
- Distinctive Image Features from Scale-Invariant Keypoints
- Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation