Metrology in a scanning electron microscope: theoretical developments and experimental validation
By Michael A. Sutton, Ning Li, D. Garcia, N. Cornille, Jean-José Orteu, S. Mcneill, H. Schreier, Xiaodong Li. 2006
172 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Computer Vision and Pattern Recognition, Mechanical Engineering
View Paper: https://www.semanticscholar.org/paper/958629681dd6a6faa7a81db0485175d25f9ea4bb
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Atomic and Molecular Physics, and Optics
- Tresa M. Pollock
- J. Stinville
- M. Echlin
- Philippe Bocher
- F. Bridier
- D. Texier
- A. D. Kammers
- Samantha Daly
In Computer Vision and Pattern Recognition
In Mechanical Engineering
Citations in the corpus
- Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation (2013, methodology): “To correct for both spatial and temporal distortions, nominally eighteen micrographs of a speckle-patterned calibration sample are captured during a pre-test calibration phase [11].”
- Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope (2013, unknown): “After loading the sample and pumping down the SEM chamber, calibration images were captured for later image distortion correction [32].”
- Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation (2016, methodology): “7, which are predominantly due to spatial distortions [15, 21, 22, 34].”