Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation

By A. D. Kammers, Samantha Daly. 2013

295 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Computer Vision and Pattern Recognition, Media Technology

View Paper: https://www.semanticscholar.org/paper/6876a063a9bb0f674b9fb5834420feef8b466e9f

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. V. Miller
2. J. Stinville
3. W. Lenthe
4. Tresa M. Pollock
5. Philippe Bocher
6. F. Bridier
7. D. Texier
8. M. Echlin

In Computer Vision and Pattern Recognition

1. V. Miller
2. J. Stinville
3. W. Lenthe
4. Tresa M. Pollock
5. M. Echlin

In Media Technology

1. J. Stinville
2. Tresa M. Pollock
3. M. Echlin

Citations in the corpus

• Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation (2016, methodology): “In order to minimize distortion errors inherent to SEM imaging [15, 18], SEM parameters were chosen following the guidelines of Kammers and Daly [15, 18].”
• Incipient slip and long range plastic strain localization in microtextured Ti-6Al-4V titanium (2016, methodology): “The parameters were selected to limit SEM distortions while maximizing the horizontal field width (HFW), discussed in more detail elsewhere for SEM DIC [17,22], with conditions shown to be optimal in prior work [16,23].”