Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope
By A. D. Kammers, Samantha Daly. 2013
161 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films
View Paper: https://www.semanticscholar.org/paper/91123a6d0a7706200961fc81899898144fdbcba0
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In Atomic and Molecular Physics, and Optics
- Tresa M. Pollock
- J. Stinville
- M. Echlin
- Philippe Bocher
- F. Bridier
- D. Texier
- A. D. Kammers
- Samantha Daly
In Electronic, Optical and Magnetic Materials
In Surfaces, Coatings and Films
Citations in the corpus
- Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation (2016, methodology): “In order to minimize distortion errors inherent to SEM imaging [15, 18], SEM parameters were chosen following the guidelines of Kammers and Daly [15, 18].”
- Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation (2013, methodology): “Applying a small-scale tracking pattern, for example in a 50µm x 50µm or smaller field of view (FOV), is particularly difficult; because this has been addressed in recent work by the authors [9] [10] it will not be discussed here.”