Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation

By J. Stinville, M. Echlin, D. Texier, F. Bridier, Philippe Bocher, Tresa M. Pollock. 2016

174 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Computer Vision and Pattern Recognition, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/dc0e8c87e290ca6539cde8b9b91341f90c86e4f6

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. V. Miller
2. J. Stinville
3. W. Lenthe
4. Tresa M. Pollock
5. M. Echlin

In Computer Vision and Pattern Recognition

1. V. Miller
2. J. Stinville
3. W. Lenthe
4. Tresa M. Pollock
5. M. Echlin

Citations in the corpus

• A combined grain scale elastic–plastic criterion for identification of fatigue crack initiation sites in a twin containing polycrystalline nickel-base superalloy (2016, unknown): “A high elastic modulus difference enhances strain near the twin boundaries [17], which induces the development of localized plasticity during cycling on the highly stressed slip system.”
• Incipient slip and long range plastic strain localization in microtextured Ti-6Al-4V titanium (2016, background): “shown to provide incomplete information on the operative slip processes [15,16].”