Strain gradients in epitaxial ferroelectrics
By G. Catalán, Beatriz Noheda, J. McAneney, L. Sinnamon, J. Gregg. 2004
230 citations recorded by the source corpus.
X-ray analysis of ferroelectric thin layers of Ba1/2Sr1/2TiO3 with different thicknesses reveals the presence of strain gradients across the films and allows us to propose a functional form for the internal strain profile. We use this to calculate the influence of strain gradient, through flexoelectric coupling, on the degradation of the ferroelectric properties of films with decreasing thickness, in excellent agreement with the observed behavior. This paper shows that strain relaxation can lead to smooth, continuous gradients across hundreds of nanometers, and it highlights the pressing need to avoid such strain gradients in order to obtain ferroelectric films with bulklike properties.
Subfields: Biomedical Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/8753b220e65a9a0a2b47939fc5e8b8b0d3b3a7f4
How researchers see this paper
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In Biomedical Engineering
In Electronic, Optical and Magnetic Materials
- A. Tagantsev
- Manuel Bibes
- G. Catalán
- P. Yudin
- J. MacManus‐Driscoll
- G. Niklasson
- J. van den Brink
- Vincent Garcia
In Materials Chemistry
- Uwe Schroeder
- Thomas Mikolajick
- P. Yudin
- A. Tagantsev
- Vincent Garcia
- Manuel Bibes
- G. Catalán
- I. Fina
Citations in the corpus
- Towards Oxide Electronics: a Roadmap (2019, methodology): “though this situation must be very far from the situation in epitaxial thin films with a strain imposed by the substrate, Williamson-Hall method has been used for thin films [197].”
- Fundamentals of flexoelectricity in solids (2013, methodology): “Assuming an exponential strain decay (as a function of the distance from the substrate) in the investigated (Ba,Sr)TiO3 thin films on a SrRuO3 substrate, Catalan et al evaluated, based on their x-ray data, the dependence of average strain gradients in the films on the film thickness.”
- Flexoelectric Effect in Solids (2013, result): “[68], and consistent with X-ray diffraction analysis [67] was that the mismatch strain does not relax suddenly at the surface but exponentially through the film.”