Radiation Effects in Flash Memories
By Simone Gerardin, M. Bagatin, Alessandro Paccagnella, K. Grurmann, F. Gliem, T. Oldham, F. Irom, D. Nguyen. IEEE Transactions on Nuclear Science, 2013
140 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/4dd5efbe2ca0585161097ebad6e61e9b527d0989
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Electrical and Electronic Engineering
Citations in the corpus
- Evolution of Total Ionizing Dose Effects in MOS Devices With Moore’s Law Scaling (2018, background): “Finally, power MOS devices [19], [87], [93], [94], flash and some other types of nonvolatile memory technologies [95]–[99], and other devices incorporating relatively Fig.”