Chemistry and electrical properties of surfaces of GaN and GaN/AlGaN heterostructures
By Tamotsu Hashizume, S. Ootomo, Susumu Oyama, M. Konishi, H. Hasegawa. 2001
152 citations recorded by the source corpus.
Subfields: Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/4d109ae468d89bb85655c7841cb02a7ae703f241
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In Condensed Matter Physics
In Electronic, Optical and Magnetic Materials
In Materials Chemistry
Citations in the corpus
- Testing the Temperature Limits of GaN-Based HEMT Devices (2010, result): “This may also be indicated by a recent experiment reporting on AlGaN/ GaN MISFET technology, where the gate metal had been deposited prior to the ohmic contact formation (and alloying at 850 ◦C) [35].”