Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000

By Michael A. Sutton, N. Li, D. Garcia, N. Cornille, Jean-José Orteu, S. Mcneill, H. Schreier, Xiaodong Li, Anthony P. Reynolds. 2007

228 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Computer Vision and Pattern Recognition, Mechanical Engineering

View Paper: https://www.semanticscholar.org/paper/431cdb5e5859720cced66a10ae838d0cf34f7c66

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

In Computer Vision and Pattern Recognition

In Mechanical Engineering

Citations in the corpus

Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope (2013, unknown): “Digital Image Correlation (DIC) has recently been combined with Scanning Electron Microscopy (SEM) [1, 2] to enable full-field displacement and strain mapping at the nano-scale, a technique referred to herein as SEM-DIC.”
Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation (2013, background): “to account for these distortions [11-13], which can be considered as time varying drift and spatial distortions.”
Plastic Strain Mapping with Sub-micron Resolution Using Digital Image Correlation (2013, methodology): “One capable method for studying deformation at this scale is digital image correlation (DIC) of high magnification images acquired using a scanning electron microscope (SEM), [4, 5, 7, 9] and [10–20].”
Application of Digital Image Correlation (DIC) in Dynamic Notched Semi-Circular Bend (NSCB) Tests (2014, methodology): “The span of the supporting pins S is 38 mm. Optimal speckle patterns have an average speckle size in the range of 3 to 7 pixels as suggested by Sutton [37, 38], and they could also be optimized using the mean intensity gradient as suggested by Pan [39].”
Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation (2016, methodology): “7, which are predominantly due to spatial distortions [15, 21, 22, 34].”