On the Escape of Ionizing Radiation from Starbursts

By Tim Heckman, K. Sembach, G. Meurer, C. Leitherer, D. Calzetti, Crystal L. Martin. 2001

152 citations recorded by the source corpus.

Far-ultraviolet spectra obtained with FUSE show that the strong C II λ1036 interstellar absorption line is essentially black in five of the UV-brightest local starburst galaxies. Because the opacity of the neutral ISM below the Lyman edge will be significantly larger than in the C II line, these data provide strong constraints on the escape of ionizing radiation from these starbursts. Interpreted as a uniform, absorbing slab, the implied optical depth at the Lyman edge is huge (τ0 ≥ 102). Alternatively, the areal covering factor of opaque material is typically ≥94%. Thus, the fraction of ionizing stellar photons that escape the ISM of each galaxy is small: our conservative estimates typically yield fesc ≤ 6%. Inclusion of extinction due to dust will further decrease fesc. An analogous analysis of the rest-UV spectrum of the star-forming galaxy MS 1512-cB58 at z = 2.7 leads to similar constraints on fesc. These new results agree with the constraints provided by direct observations below the Lyman edge in a few other local starbursts. However, they differ from the recently reported properties of star-forming galaxies at z ≥ 3. We assess the idea that the strong galactic winds seen in many powerful starbursts clear channels through their neutral ISM. We show empirically that such outflows may be a necessary—but not sufficient—part of the process of creating a relatively porous ISM. We note that observations will soon document the cosmic evolution in the contribution of star-forming galaxies to the metagalactic ionizing background, with important implications for the evolution of the IGM.

Subfields: Astronomy and Astrophysics, Electrical and Electronic Engineering, Instrumentation

View Paper: https://www.semanticscholar.org/paper/379ba2981eabb7b2c7a5c59879a01d740a0aa6c2

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In Astronomy and Astrophysics

  1. L. Hernquist
  2. P. Hopkins
  3. R. Dav'e
  4. Volker Springel
  5. C. Conroy
  6. A. Dekel
  7. Simon D. M. White
  8. R. Somerville

In Electrical and Electronic Engineering

  1. Simon D. M. White
  2. C. Steidel
  3. A. Dekel
  4. A. Meiksin
  5. M. Pettini
  6. T. Heckman
  7. Renyue Cen
  8. G. Kauffmann

In Instrumentation

  1. L. Hernquist
  2. P. Hopkins
  3. R. Dav'e
  4. C. Conroy
  5. A. Dekel
  6. Simon D. M. White
  7. Volker Springel
  8. R. Somerville

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