Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

By M. Bushnell, V. Agrawal. 2000

1,629 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/30445d775d6c615f0250fa605280bed0820cd4cc

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In Hardware and Architecture

Citations in the corpus

Security analysis of integrated circuit camouflaging (2013, background): “Traditionally, reverse engineering of IC’s has been performed to collect competitive intelligence, to verify a design, and to check for commercial piracy and patent infringements.”
Synthesis and optimization of reversible circuits—a survey (2011, background): “Test techniques are sensitive to dominant fault types, but fortunately CMOS circuits can be tested reasonably well assuming only stuck-at fault models [Bushnell and Agrawal 2000].”
Fault Identification Via Nonparametric Belief Propagation (2009, background): “circuit matrix is , the fault signature is then . Note that the underlying assumption is that the number of actual faults in a single circuit is small, which explains the imbalance in the fault prior probability .F or moreinformationaboutdetectingfaultsinlinearanalogcircuits, see, e.g., [ 31 ].”
On Improving the Security of Logic Locking (2016, background): “Secure communication infrastructure is needed if the keys is to be loaded remotely onto the chip [3], [27].”
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain (2014, background): “The functionality of a component can be checked by using functional tests [45], [46].”
Evaluating the security of logic encryption algorithms (2015, methodology): “We assume all flip-flops in a sequential design can be accessed through the scan chain, which is likely to be true for prevalent design-for-testability (DFT) [3] solutions.”
A singular-value decomposition approach for ambiguity group determination in analog circuits (2003, background): “Finally, it is worth pointing out that the proposed approach is applicable only to linear analog circuits, but this is not so big a restriction because, at present, the analog part of modern complex systems is almost all linear, while the nonlinear functions are moved toward the digital part [ 11 ].”