Self-aligned n-channel germanium MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate
By Huiling Shang, Kam-Leung Lee, P. Kozłowski, C. D'Emic, I. Babich, E. Sikorski, Meikei Ieong, H.-S.P. Wong, Kathryn W. Guarini, Wilfried E. Haensch. IEEE Electron Device Letters, 2004
163 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/25d696075449db4c895b4553e9edfda6aa7ddf34
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- Carrier-Transport-Enhanced Channel CMOS for Improved Power Consumption and Performance (2008, background): “It has been reported so far, however [41], [42], that”
- Ge-Interface Engineering With Ozone Oxidation for Low Interface-State Density (2008, background): “However, Ge NMOS exhibited poor drive current and low mobility by several demonstrations worldwide [6], [7].”