Defect states at III-V semiconductor oxide interfaces

By L. Lin, John Robertson. 2011

136 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/22d6d59c1f814303c95c1d65dee38c9bf0870182

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Kelin J. Kuhn
2. Bevan M. Baas
3. Aaron Stillmaker
4. Qiang Li
5. Kei May Lau

In Materials Chemistry

1. Kelin J. Kuhn

Citations in the corpus

• Considerations for Ultimate CMOS Scaling (2012, background): “Note that the states generated by group V dimers of In-containing compounds are predicted to lie inside the conduction band [176], which may explain the”