Experimental analysis and theoretical model for anomalously high ideality factors (n≫2.0) in AlGaN/GaN p-n junction diodes
By J. M. Shah, Y. Li, T. Gessmann, E. Schubert. 2003
448 citations recorded by the source corpus.
Subfields: Condensed Matter Physics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/153cddfd02fa7ecaf46ebbd531ebbde7854ae9d7
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In Condensed Matter Physics
In Electrical and Electronic Engineering
Citations in the corpus
- GaN-on-Si Vertical Schottky and p-n Diodes (2014, background): “n is attributable to the relatively high Ohmic resistance on p-GaN [7].”
- Ultra-low Threshold electrically pumped quantum dot photonic crystal nanocavity laser (2011, result): “increases. We measure an ideality factor of 2.69 at room temperature. High ideality factors have been observed in GaN p-n junctions and have been attributed to rectifying metalsemiconductor junctions [S5]. We suspect that the metal contacts are no longer ohmic at low temperatures due to the low dopi”