Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000

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Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation (2013, methodology): “[11-13] is adapted to correct for the effects of stress relaxation that occurs during the image scan and can be particularly detrimental to drift distortion correction.”
Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation (2016, methodology): “7, which are predominantly due to spatial distortions [15, 21, 22, 34].”
Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope (2013, positive): “Digital Image Correlation (DIC) has recently been combined with Scanning Electron Microscopy (SEM) [1, 2] to enable full-field displacement and strain mapping at the nano-scale, a technique referred to herein as SEM-DIC.”
Plastic Strain Mapping with Sub-micron Resolution Using Digital Image Correlation (2013, methodology): “One capable method for studying deformation at this scale is digital image correlation (DIC) of high magnification images acquired using a scanning electron microscope (SEM), [4, 5, 7, 9] and [10–20].”